Abstract:
Different vigour tests were conducted in maize seeds cv. '89MAY70' in order to determine the
highest correlation between viability and vigour; and any possible vigour test methods beside the
ISTA validated radicle emergence test. The results of germination tests [normal germination rate
(NGR)] and vigour tests [first count (FC), mean germination time (MGT), germination index
(GI), radicle emergence (RE), electrical conductivity (EC) and cold test (CT)] were evaluated on
the bases of 6 different seed calibration classes, which were composed depending on the seed
shape (round and flat) and seed size (small, medium and large). Significant differences (P?0.05)
were found both in germination and vigour tests due to seed shape and seed size. Especially,
viability and vigour levels of flat shaped seeds were determined higher than those of the round
shaped ones, irrespective of the seed size. Moreover, the correlations between normal
germination rate and vigour parameters were investigated in a correlation matrix. Consequently,
the highest correlation between seed viability and vigour was found between NGR and GI. This
was followed by NGR and EC, RE, FC, MGT, respectively. However, the correlation between
NGR and CT was statistically not significant (P?0.05). These results suggest that in maize seeds
GI and EC are promising vigour test methods beside the RE test, which is validated by ISTA. EC
test should be used to determine seed vigour before any treatment (i.e., fungicide treatment, film
coating, pelleting, etc.) used in seed technology, however, GI and RE tests could be used before
and after any seed treatment. |
